Dr. Jeffrey White
Sr. Research / Application Scientist
Improved Measurement of Single/Multi-Layer Wall Thickness of Blow Molded Objects
Plastics 101's - Session 9
Monday, October 11, 2021
3:45 p.m. to 4:30 p.m.
Presentation Description:
A ubiquitous need for any blow molding process is timely, accurate and repeatable measurement of wall thickness for the product. This need has become especially critical with the drive to create more complex products with multiple thinner layers, particularly when using more recycled and novel materials.
An ideal sensor would be non-contact, able to make fast measurements (1000/sec) and perhaps most importantly have excellent repeatability (±0.2 mils or better) regardless of user. The unit would need to be deployable in factory quality laboratories, new product development or pilot-type applications, incoming material inspection stations (e.g., preforms) and for both at-line and even in-line in production environments for single layer and multilayer products. A THz sensor is capable of fulfilling these requirements.
The presentation will include an introduction to the THz layer thickness measurement technology and a brief comparison to other wall thickness measurement sensors.
Measurement results can be obtained via both automated installed units or using a handheld sensor for quick measurement checks. Measurements will be presented for finished products, incoming materials, during new product inspection for development / pilot line needs and for in-line parison extrusions (dependent on NDA agreements).
This measurement capability will likely be new to many potential users. Much of the presentation will consider how the sensor could be used to address the complex measurement needs for today’s manufacturers.
Speaker Biography:
Jeff White has worked as an Application Scientist for Luna Innovations since 2002. He is responsible for developing THz measurement sensor applications, primarily for industrial applications. Additional applications have included measurement of the Sprayed-on-Foam-Insulation (SOFI) for the external fuel tanks for the NASA Shuttle program and coating thickness for
the specialty coatings on the F-22 and F-35 military aircraft.
More pertinent applications include
the layer thickness measurement for multilayer products, e.g., the EVOH Barrie layer in many blow molded articles. Measurements have been demonstrated for in-line (continuous measurement of the parison before being clamped in a cavity), at-line (the rapid multi-position, multilayer thickness measurements of the article immediately after blow molding and rapid critical points checks as articles are conveyed past the sensor and off-line in factory, research and new product development laboratories.
Jeff has always been involved in measurement sciences and applications starting with his B.S. in Chemistry from Michigan State University, Ph.D in Chemistry (Analytical) from the University of Illinois at Urbana-Champaign, Post-Doc work with University Distinguished Professor William G. Fateley at Kansas State University and through a professional staff position in the Jonathon Amy Facility for Chemical Instrumentation at Purdue University.
Industrial positions at Perceptron and his current position at Luna (20 years) have always involved advanced methods of measuring product quality.